Save. Share. Connect.
Monday, October 16, 2017
VOLUME -27 NUMBER 2
Publication Date: 02/1/2012
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: Components and Distribution
Product Preview: Electronics West / MDM
February 2012 Issue
Add Message Board
Heidenhain: New Metrology Software
New metrology software increases functionality.
Schaumburg, IL — Heidenhain has introduced the latest version of its PC-based QUADRA-CHEK Metrology software, which provides advanced functionality for inspection measurement machines. This software makes it possible to conveniently perform 2-D and 3-D metrology measuring tasks when standard DRO products will not suffice.
Labeled the IK5000 version 2.96, this powerful inspection package builds upon the original Metronics QUADRA-CHECK QC5000 software by introducing new functionality such as 3-D profiling capabilities that can provide measurement and graphic evaluation of 3-D contours using multi-sensor and tactile measuring machines. This new option, used for profile measurements, is able to import a 3-D CAD file (either STEP or IGES) and compare it with the actual measured part. Part Programming improvements have been added to support compensation for the thermal behavior of products that experience a shrinkage or growth of material during the manufacturing process. This will allow users to write a single inspection program for measuring parts with materials having a known growth or shrink rate throughout the manufacturing process.
Improvements have also been added to already existing Radial and Palletize methods of automatic part programming routines. These methods are designed to help users when there are common features or parts that repeat angularly, around a datum, or based on a palletized grid layout. On Video-based Inspection machines, these improvements will retain specific video tool sizes and the positions needed for these measurements, and then repeat them based on the angle they are located around the datum or in reference to a linear layout. The new Palletize grid functionality will also allow the user to graphically select which parts in the grid are required for measurement, and only run the program in those locations.
The IK5000 version 2.96.0 will now also offer compatibility for PCs using Windows 7 (32-bit) operating systems as well as Windows XP and Vista.
Contact: Heidenhain Corp., 333 E. State Parkway, Schaumburg, IL 60173
847-490-1191 fax: 847-490-3931 E-mail: email@example.com Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | firstname.lastname@example.org
powered by GIM