Saturday, June 23, 2018

Home/Current Issue >  Product Previews >  AATE and IPC MW 11 > 

3D Laser Scanning Microscope from Keyence

Woodcliff Lake, NJ — The new Keyence VK-X Series 3D Laser Scanning Microscopes combine the capabilities of SEMs and non-contact roughness gauges with the simplicity of an optical microscope. This newly released system, called the VK-X200, now provides an unprecedented 0.5 nanometer Z-axis resolution ...
search login