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Tuesday, May 24, 2016
VOLUME -26 NUMBER 10
Publication Date: 10/1/2011
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: PCB and Production
Product Preview: productronica
October 2011 Issue
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MEMS Test and Calibration from Multitest
InPhone test system.
Rosenheim, Germany — Multitest has shipped the first InPhone system to a European site of a major IDM (Integrated device manufacturer). Combined with the Multitest InStrip
handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones. The InStrip has been configured for InCarrier
test. Thus, singulated MEMS packages can be tested with the high parallelism of the InStrip handler.
Microphone MEMS devices are becoming more and more important for state-of-the-art mobile communication applications. These applications require an expanded linear frequency range and usually need small packages, but at the same time they are very cost-sensitive.
The InPhone solution is based on an excitement in a pressure chamber that ensures homogeneous acoustic stimuli across all parallel tested packages. The InCarrier concept supports stable high-parallel test even for small packages. According to the company, this setup provides unique performance and cost-of-test advantages.
Contact: Multitest elektronische Systeme GmbH, Aussere Oberaustrasse 4, D-83026 Rosenheim, Germany
+49 8031 406 216 fax: +49 8031 406 148 E-mail: firstname.lastname@example.org Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
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