Thursday, October 20, 2016
Publication Date: 06/1/2011
Archive >  June 2011 Issue >  Special Features: Test and Measurement > 
Increased Probe Density with Guided Pin Fixturing

Although other test and inspection technologies such as automated optical inspection have tried to supplant it, in-circuit test (ICT), which has been around since the 1970s, still delivers the highest test coverage with the least diagnostic ambiguity at the least cost for circuit board ...
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Improving Nano-Scale Imaging with Negative-Stiffness Isolators

Traditionally, bungee cords and high-performance air tables have been the vibration isolators most used for scanning probe microscopy (SPM) and near-field scanning optical microscopy (NSOM). The ubiquitous passive-system air tables, adequate until a decade ago, are now being seriously ...
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Improving Inspection with Digital Microscopes

Visually inspecting parts can be both challenging and time-consuming, especially when using traditional optical microscopes. With a limited depth-of-field, an inability to save images exactly as they are seen, lack of measurement tools and difficulty in properly illuminating a target, inspecting ...
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PC Board Product Assurance Testing

How can a user of Printed Circuit Boards know they received what they specified? Recently, a field failure called into question some of the traditional methods of ensuring product performance when the failure was traced back to a printed circuit board problem. During analysis of the product ...
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Counterfeit Devices: An Ongoing Menace

About seven years ago an independent distributor asked us to examine some parts that he had purchased from an offshore source — in this case, mainland China. He was not sure that the parts were marked correctly. He asked we could determine if the parts were, in fact, correctly marked ...
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