Sunday, June 24, 2018
Publication Date: 06/1/2011
Archive >  June 2011 Issue >  Special Features: Test and Measurement > 
Increased Probe Density with Guided Pin Fixturing

Although other test and inspection technologies such as automated optical inspection have tried to supplant it, in-circuit test (ICT), which has been around since the 1970s, still delivers the highest test coverage with the least diagnostic ambiguity at the least cost for circuit board ...
Read More
Improving Nano-Scale Imaging with Negative-Stiffness Isolators

Traditionally, bungee cords and high-performance air tables have been the vibration isolators most used for scanning probe microscopy (SPM) and near-field scanning optical microscopy (NSOM). The ubiquitous passive-system air tables, adequate until a decade ago, are now being seriously ...
Read More
Improving Inspection with Digital Microscopes

Visually inspecting parts can be both challenging and time-consuming, especially when using traditional optical microscopes. With a limited depth-of-field, an inability to save images exactly as they are seen, lack of measurement tools and difficulty in properly illuminating a target, inspecting ...
Read More
PC Board Product Assurance Testing

How can a user of Printed Circuit Boards know they received what they specified? Recently, a field failure called into question some of the traditional methods of ensuring product performance when the failure was traced back to a printed circuit board problem. During analysis of the product ...
Read More
Counterfeit Devices: An Ongoing Menace

About seven years ago an independent distributor asked us to examine some parts that he had purchased from an offshore source — in this case, mainland China. He was not sure that the parts were marked correctly. He asked we could determine if the parts were, in fact, correctly marked ...
Read More
search login