Save. Share. Connect.
Wednesday, July 27, 2016
VOLUME -26 NUMBER 5
Publication Date: 05/1/2011
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: Components and Distribution
Product Preview: EDS
May 2011 Issue
Add Message Board
Aehr Receives Order for Advanced Burn-in/Test System
Fremont, CA — Aehr Test Systems (Nasdaq: AEHR), a supplier of semiconductor test and burn-in equipment, has received an order for its newest system, the Advanced Burn-in and Test System (ABTS). This is the first ABTS ordered by this customer and the system is configured to do burn-in and test of high pin count logic ICs. The system has 320 IO channels and is also backward compatible with Aehr Test Systems' earlier generation ATX system, preserving the customer's investment in burn-in-boards. The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come.
Contact: Aehr Test Systems, 400 Kato Terrace, Fremont, CA 94539
510-623-9400 fax: 510-623-9450 E-Mail: email@example.com Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | firstname.lastname@example.org
powered by GIM
You were trying to view a protected page.
Please login to gain access or cancel to go back to the site.
Remember User Name
Stay signed in.
Forgot your password?