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Goepel Vector Link for Agilent with JTAG Platform
Agilent vector migration screen photo.
Jena, Germany — Goepel electronic has introduced a special linking software to migrate test vectors to Agilent In-Circuit Testers (ICT). The vector link was developed in cooperation with the GATE
Program member WG-Test and supports the transfer of hybrid Boundary Scan test sets to the parallel pin electronics at parallel pin level fault diagnosis.
Direct transfer of test vectors — which have already been proven on the prototype — to the New Product Introduction (NPI) stage is an important aspect of the testing process. According to the company, the vector link is available for the entire Agilent ICT product range — complementing the existing high performance integration solutions — helping users to react to the production test's individual performance demands.
Test vector generation and evaluation used in conjunction with the high-quality pin electronics of the HP/Agilent 3070 test system can be performed off-line. And the system can use already-generated and checked test vectors. Signals can be sent to the standard test fixture without the need for additional pin electronics — resulting in simple and efficient test development, combined with high test coverage.
The vector link is a bidirectional software bridge between the Agilent ICT and the JTAG/Boundary Scan software SYSTEM CASCON
, and all platforms are supported. The vector transfer is implemented by direct generation of the native ICT format. All serial TAP vectors as well as parallel I/O vectors are transferred to the pin electronics.
Contact Goepel electronics LLC, 9600 Great Hills Trail, Suite 150W, Austin, TX 78759
888-446-3735 or 512-782-2500 E-mail: info-AT-goepelusa.com Web:
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