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Friday, December 2, 2016
VOLUME -26 NUMBER 2
Publication Date: 02/1/2011
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: Components and Distribution
Product Preview: Electronics West / MDM
February 2011 Issue
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STI Electronics Test Protocol Receives Global Technology Award
David Raby (left) STI President & CEO, receives award from Trevor Galbraith, Global SMT & Packaging.
Madison, AL — STI Electronics, Inc., a full service organization providing training, electronic and industrial distribution, consulting, laboratory analysis, prototyping, and small- to medium-volume PCB assembly, has been awarded a Global Technology Award in the category of Contract Services for its Accelerated SIR Test Protocol for Hi-Rel Electronics Life Reliability Testing. The award was presented to David Raby, President & CEO, during a Tuesday, October 26, 2010 at SMTA International in Orlando, FL.
STI's materials qualification test protocol uses a modification to standard SIR test procedures. With faster data sampling rates and a more aggressive test environment (moisture in addition to temperature cycling), STI's accelerated SIR test protocol is designed to provide a cost-efficient, quick-turn evaluation of both assembly materials and manufacturing processes through industry standard SIR testing (captured every 24hrs) and STI's supplementary voltage monitor testing (captured every 60 seconds).
Contact: STI Electronics, Inc., 261 Palmer Rd., Madison, AL 35758
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