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Friday, December 9, 2016
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NEPCON South China '16
SEMICON West '16
Atlantic Design/ATX/MDM '16
NEPCON China,SMT/Hybrid Pkg,EDS,EWPTE '16
ATX/MDM West '16
productronica,The ASSEMBLY Show, IMAPS, MDM/Minneapolis '15
Nepcon South China '15
SEMICON West '15
ATX/MDM EAST '15
EDS, SMT/Hybrid Pkg,Wire Tech Expo '15
NEPCON China '15
ATX WEST/APEX '15
AATE and IPC MW 11
SMTAI, Autotest, ATX MW/MDM and Assembly '14
SEMICON West '13
Electronics West/MDM and IPC/APEX '13
SEMICON West '14
NEPCON China, SMT/Hybrid Pkg, EDS, NWPTE '14
IPC APEX '14
Electronics West/MDM 10
ATX Midwest, IMAPS, PCB West '13
ATX West '14
ATExpo & IPC MW 07
NEPCON China '13, EDS, more
SEMICON WEST/Intersolar '12
NEPCON China Product Preview '12
Atlantic Design/MDM 10
Electronics West/MDM 11
SEMICON WEST 10
Atlantic Design/MDM 11
ATLANTIC DESIGN & MFG '13
Atlantic Design/MDM 09
SEMICON WEST 08
NEPCON South China '13
ATExpo & IPC MW 08
Electronics West/MDM 08
NEPCON China Product Preview '13
Electronic West/MDM 09
SMTAI and productronica '13
Multi tradeshow Product Preview '12
AATE/IPC Midwest 10
Electronics West/MDM 12
ATE and IPC MW 09
SMTAI and productronica '13
Atlantic Design/MDM 08
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Digitaltest Flying Prober Uses Boundary Scan
Condor flying-probe test system.
Stutensee, Germany — Digitaltest has integrated JTAG Boundary Scan into the MTS500 Condor flying probe tester, which in addition to traditional ICT test routines, is also capable of performing functional tests. Tests of prototype boards and small batches are streamlined and cost-effective.
Combining the flying prober with boundary scan, the benefits of both methods combine to create a powerful test solution. Besides the classical in-circuit-test using four flying probes, functional tests using up to 1,012 fixed probes accessing from the bottom side are possible. The fixed probes can access the UUT using a simple magnetic probe bed or a vacuum operated adaptor solution. Integrating JTAG Technologies' boundary scan test methods into Condor test programs while accessing the TAP Access Port allows for infrastructure and interconnect test without the need for contacting additional nets of the UUT.
For debugging or test runs, JTAG's ProVision Software can take over control of the four flying probes. Similarly, hardware and software can be controlled by Digitaltest's CITE test software.
Also on display: Digitaltest's C-Link CAD/CAM Viewer supplements the iTAC.MES.Suite's repair and diagnostics function by optimally displaying printed circuit board assembly layout and the related circuit diagrams. Digitaltest's interface portfolio ensures problem-free conversion of the different CAD/CAM data formats.
The CAD/CAM Viewer is integrated via a bi-directional, downwardly-compatible API interface. This integration scenario permits the roll-out of the iTAC/Digitaltest software portfolio for all tools and constitutes a unique selling proposition compared with all standard paperless repair solutions.
Contact: Digitaltest, Inc., 5046 Commercial Circle, Suite C, Concord, CA 94520
925-603-8650 fax: 925-603-8651 Web:
See at electronica Booth #A1.638.
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