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Publication Date: 08/1/2010
Archive >  August 2010 Issue >  Product Preview: AATE/IPC Midwest > 

XJTAG Intros Fast Programming Test Tools
New high-speed programming tools.
Cambridge, UK — XJTAG is the first company to announce support for Micron Omneo Phase Change Memory (PCM) — which reportedly enables enhanced system performance, and is programmed in situ after the board is assembled.

XJTAG, working with Micron, has developed a way to program PCM at close to its maximum programming speed using the company's boundary scan system. It will allow customers to program PCM quickly on production lines or in development labs. This builds on its successful XJFlash solution for high-speed programming of Flash memories.

The boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis. The company's innovative software calculates how to utilize the boundary scan chain to maximize test coverage and accelerate programming of devices such as memories and PLDs.

Used in conjunction with the boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices provided there is an FPGA or CPU on the target board and this is connected up to the JTAG chain correctly.

Contact: XJTAG, Dirac House, St. John's Innovation Centre, Cowley Road, Cambridge CB4 0WS UK +44 (0)1223 223007 fax: +44 (0)1223 223009 E-mail: Web:

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