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VOLUME -25 NUMBER 8
Publication Date: 08/1/2010
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: Test and Measurement
Product Preview: AATE/IPC Midwest
August 2010 Issue
Electronic Mfg. Products
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Goepel Boosts Processor Emulation Speed
Jena, Germany — Goepel electronic has introduced new features designed specifically for parallel execution of VarioTAP
Processor Emulation with the Boundary Scan software platform SYSTEM CASCON
. These new core functions enable the creation of massive parallel (Gang) test and programming applications through Processor Emulation with just a single Boundary Scan Controller.
According to the company,the improvements VarioTAP technology can meet market demands for high throughput in high volume applications. In addition, the single controller solution overcomes the need for linear Multi-Site Instrumentation per Unit Under Test.
These devices therefore allow the fusion and gang execution of Boundary Scan and JTAG Processor Emulation using a central platform controller, which can reduce investment costs considerably without making compromises in performance.
VarioTAP is an adaptive streaming technology for JTAG TAP signals that allows Flash devices to be programmed and Processor Emulation Tests (PET) and Boundary Scan Tests to be executed in combination within the same test program.
The new VarioTAP features implement special synchronous streaming capabilities for multiple TAPs with same-type target processors, which allows a synchronized handling of emulation sequences that are normally executed asynchronously per Unit Under Test (UUT). The number of identical, parallel addressable targets is in principle not limited and depends on the test system hardware in use. With the SCANFLEX hardware platform, gang applications with up to 8 targets can be realized. Various test controllers are available, with interfaces such as USB2.0, PCI, PCI Express, PXI, PXI Express, FireWire, and Gbit LAN.
The new VarioTAP capabilities are especially important in medium- and high-volume production of boards that have an MCU (Micro Controller Unit) with embedded Flash. Such applications can now have faster throughput because of parallel execution on multiple identical boards, while at the same time allowing the combination of Boundary Scan Tests, dynamic Emulation Tests, or In-System Programming (ISP) of PLD. This also includes boards with multiple TAPs or with ScanRouter devices.
Contact: Goepel electronics LLC, 9600 Great Hills Trail, Suite 150W, Austin, TX 78759
888-446-3735 or 512-782-2500 E-mail: info-AT-goepelusa.com Web:
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