Wednesday, June 20, 2018
Publication Date: 08/1/2010
Archive >  August 2010 Issue >  Special Features: Test and Measurement > 
The Case for Functional ATE Testing

Project managers within industries such as bio med, alternative energy, smart appliances, communications, consumer electronics and defense now increasingly look to custom designed and manufactured automatic testing equipment (ATE) that can functionally test new products that incorporate ...
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Electrically with JTAG/Boundary Scan or Mechanically with ICT?

Based on a proposal by the Joint Test Action Group (JTAG) some 15 years ago, the IEEE Std. 1149.1 became the basis of a revolutionary digital test technology for electronic assemblies named Boundary Scan or JTAG. For increasingly complex PCBs, Boundary Scan today is no longer an option ...
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Test & Measurement Reaches for Debug

Reducing test cycle time while increasing test coverage is an important goal for equipment builders serving all types of markets, including military, aerospace, and transportation.
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Versatile Boundary Scan Also Programs and Debugs

The JTAG standard IEEE 1149.1 — developed by the Joint Test Action Group — was originally developed to facilitate structural testing of assembled PCBs, as well as testing boards where it is impossible to make contact with component pins with external probes. This type of testing becomes ...
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Using Reverse Engineering to Recreate Lost CAD Data

What do you do when your customer, a major transportation equipment manufacturer has a big problem with its electronics? The company has a large number of older printed circuit boards that are still used for the company's legacy equipment. There is no PC board data in any form. CAD, BOM ...
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High Resolution Optical Inspection Solutions

As electronic systems get smaller, the division between semiconductor and SMT manufacturing is blurring. For microelectronics inspection the opposite is happening. The division between AOI manufacturers is becoming more defined with only the highest quality AOI manufacturers being able ...
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