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Monday, September 26, 2016
VOLUME -25 NUMBER 7
Publication Date: 07/1/2010
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July 2010 Issue
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Coordinate Metrology Systems Conference Meets in Reno
Benbrook, TX — The Coordinate Metrology Society (CMS) has chosen 25 technical white papers to be presented at its annual Coordinate Metrology Systems Conference (CMSC) from July 12-16, 2010, at the world-class Grand Sierra Resort located in Reno, Nevada.
White paper submissions were received from metrology experts and scientists from research laboratories, universities, and leading manufacturers in North America, Eastern and Western Europe, India and Japan. Topics to be presented are as diverse as the speaker roster, and include aligning the James Webb Space Telescope, Airbus A320 Aircraft Assembly Line Alignment, and other applications of photogrammetry, articulating arms, laser radar, laser trackers, 3D scanners, 3D vision systems and more.
The Keynote speaker will be Mr. Thomas A. Greenwood, Program Director of the A350XWB Leading Edge Spar at Spirit AeroSystems, Inc. In addition, the conference will host four workshops covering the Coordinate Metrology Certification Initiative, 3D Imaging, Gage R & R, and GD&T. CMSC 2010 also features an Exhibit Hall showcasing portable measurement systems (PCMMs), software, accessories, peripherals, and service providers supplying the needs of the industrial measurement marketplace. More than 35 exhibitors participated at last year's conference, where ideas, concepts, and theory flow freely among the participants. Conference attendees hail from prominent science/research laboratories, educational institutions, and industries such as aerospace, satellite, automotive, shipbuilding, power generation, and general engineering. The Coordinate Metrology Systems Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC has achieved world renowned for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other conference rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.
Contact: Coordinate Metrology Society, 1404 Timberline Drive, Benbrook, TX 76126-3821
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