Save. Share. Connect.
Thursday, October 27, 2016
VOLUME - NUMBER
Electronic Mfg. Products
Add Message Board
Goepel Develops DDR3 Memory Test Module
Test module for DRAMs.
Jena, Germany — Goepel electronic has introduced the CION Module
/SO-DIMM204-3, the newest member of the company's CION product family. The new low-cost, digital I/O module is controlled through an IEEE 1149.1 TAP (Test Access Port) and provides resources for connectivity testing of all signal and voltage supply pins on DDR3-SDRAM SO-DIMM204 sockets compliant with JEDEC standards JESD21-C and JESD79-3C.
The CION Module/SO-DIMM204-3 is the 14th member of the CION module family, is mechanically compliant with JEDEC Std. MO268 and can be plugged directly into the socket to be tested; the voltage configuration for the interface is done automatically. Several CION modules of the same or different types can be cascaded in a daisy-chain configuration; the TAPs can be programmed externally for flexibility.
The module uses the company's Boundary Scan ASIC for the structural test of all SO-DIMM204 signal and power supply pins. All test channels can be switched input/output/tristate.
This new hardware module is fully supported by all ScanBooster
JTAG/Boundary Scan controllers and by the integrated JTAG/Boundary Scan software platform SYSTEM CASCON
Contact: Goepel electronics LLC, 9737 Great Hills Trail, Suite 170, Austin, TX 78759
888-446-3735 or 512-782-2500 E-mail: info-AT-goepelusa.com Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
powered by GIM