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Goepel Develops DDR3 Memory Test Module
Test module for DRAMs.
Jena, Germany — Goepel electronic has introduced the CION Module
/SO-DIMM204-3, the newest member of the company's CION product family. The new low-cost, digital I/O module is controlled through an IEEE 1149.1 TAP (Test Access Port) and provides resources for connectivity testing of all signal and voltage supply pins on DDR3-SDRAM SO-DIMM204 sockets compliant with JEDEC standards JESD21-C and JESD79-3C.
The CION Module/SO-DIMM204-3 is the 14th member of the CION module family, is mechanically compliant with JEDEC Std. MO268 and can be plugged directly into the socket to be tested; the voltage configuration for the interface is done automatically. Several CION modules of the same or different types can be cascaded in a daisy-chain configuration; the TAPs can be programmed externally for flexibility.
The module uses the company's Boundary Scan ASIC for the structural test of all SO-DIMM204 signal and power supply pins. All test channels can be switched input/output/tristate.
This new hardware module is fully supported by all ScanBooster
JTAG/Boundary Scan controllers and by the integrated JTAG/Boundary Scan software platform SYSTEM CASCON
Contact: Goepel electronics LLC, 9737 Great Hills Trail, Suite 170, Austin, TX 78759
888-446-3735 or 512-782-2500 E-mail: info-AT-goepelusa.com Web:
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