Saturday, December 10, 2016
VOLUME -25 NUMBER 5
Publication Date: 05/1/2010
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Archive >  May 2010 Issue >  Electronic Mfg. Products > 

Seica Develops Thermal Scan for Probers
Thermal scan unit.
Salem, NH — Seica, Inc. has just introduced "Flying IC Thermal Detection Units" on its line of Aerial flying probers. Two IC Thermal Detection Units are positioned on each side of the unit under test to detect thermal parameters of ICs under power. The purpose is to compare temperatures of known good boards to suspect boards and indict bad components in the depot repair environment. Seica is the first flying prober OEM to introduce this feature on its line of flying probers.

Introducing thermal sensors with the traditional features already present on flying probers, such as in-circuit, functional, boundary scan and power up test, make the flying prober a continually evolving test tool that can satisfy the demanding test needs of the production and depot repair markets.

In the market today, there are instances of large "bone piles" of boards that require many hours of debug and testing by skilled senior technicians or engineers to return them to operational condition. The IC Thermal Detection Unit capabilities allows for precise thermal measurement of the IC or other components while the part is powered up even under low voltage conditions. The simplicity of a thermal profile test can help reduce labor repair cost and improve inventory turnover.

The Pilot line is one of the world's most versatile and complete line of automatic flying probe test systems, offering the widest range of solutions and performances for flying probe test of electronic boards on the market today. Models range from 2 to 8 test probes, accessing simultaneously one or both sides of the board, which can be positioned either horizontally or vertically. The Aerial Prober is based on the company's proprietary VIVA Integrated Platform (VIP) core hardware and software. Designed to meet the stringent demands of today's industry, the prober's simple programming and operation mean it can be operated by specialist and non-specialist test personnel alike as part of a highly cost-effective test strategy.

Suitable for testing prototypes, samples and small-to-medium production runs, the prober reduces the investment and time needed for board development while providing maximum test flexibility.
Contact: Seica Inc., 50A Northwestern Drive, Suite 10, Salem, NH 03079 603-890-6002 fax: 603-890-6003 Web:
http://www.seica.com

 
 
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