Monday, June 18, 2018

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Nikon Metrology Unveils QA X-Ray System

Leuven, Belgium — Nikon Metrology is introducing the compact yet versatile XT V 130 X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards. It is a compact and affordable X-ray system for automated QA on serial-produced electronic samples.
Hidden electronic defects can be detected efficiently early in the manufacturing process by taking an in-depth look at the inside of electronic specimens.

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