Tuesday, September 27, 2016
VOLUME -24 NUMBER 8
Publication Date: 08/1/2009
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Archive >  August 2009 Issue >  Special Features: Test and Measurement > 
Combining Boundary Scan and JTAG Emulation


Boundary Scan and JTAG Emulation are two perfectly complementary test methodologies, which are fused into one extremely flexible and powerful technique...
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Integrated MEMS Test Cells for High-Throughput


Integrated test cells, specifically designed for testing MEMS devices, represent a substantial innovation today. These ready-to-use cells are able to support the market for MEMS components, whose demand is...
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Pressure Uniformity Control for Dry Film Resist Lamination


When laminating a printed circuit board, we try to achieve good contact between the resist and the substrate surface by making the resist flow to conform to the surface topography. Flow is achieved by lowering the resist viscosity by heating it, and by applying...
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How AOI Turned QC Around in Holland


Electronics manufacturers are naturally expected to deliver quality assured products, free of defects or returns issues. However they are also under increasing pressure to meet ever-shorter delivery times...
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Clamp Meters: Getting the Most-Needed Functions


When you are responsible for installations, maintenance, repairs, and overhauls of "everything industrial," your toolbox can fill up pretty quickly with all the tools and test equipment needed to constantly change gears from job to job. Jobs can range from electrical testing on pumps
, motor controls, and boilers, to heating and cooling measurements, to lift and conveyance systems ... Read More
 
 
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