Save. Share. Connect.
Monday, July 25, 2016
VOLUME -24 NUMBER 7
Publication Date: 07/1/2009
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Features: Assembly and Packaging
Product Preview: Semicon West
July 2009 Issue
Electronic Mfg. Products
Add Message Board
Goepel Intros New JTAG Tester
JULIET test system.
Jena, Germany — Goepel electronic has introduced JULIET
— JTAG UnLimItEd Tester — a family of completely integrated standalone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. They are equipped with a specific interface to an exchangeable adaptor providing the capability for fast changes to accommodate different Units Under Test (UUT).
Designed as a Commercial Off The Shelf (COTS) product, the desktop systems are available in the versions JULIET-Base and JULIET-Standard, with differences in the number of available I/O channels (120/240) and TAPs (2/4), as well as in the scan performance (16MHz/50MHz). All JULIET systems provide 4 independently programmable UUT voltages incl. current measurements for 2 and 4 registers for covering gang-applications, and an effective adaptation area of 310 x 210mm. An integrated exchangeable-adaptor appliance with type recognition allows standard UUT adaptations over needle contacts or real connectors with simultaneous access to all interface signals even in the active state.
All JULIET systems provide for execution of Boundary Scan tests — In-System-Programming (ISP) of Flash and PLD, functional emulation tests, MCU programming, and interface tests, with the active process shown on an integrated display. The control of the complete process is carried out by an external PC through USB or LAN interface. The software consists of standard versions of the JTAG/Boundary Scan program package SYSTEM CASCON
, and laboratory test programs can be continuously used.
JULIET-Standard offers the performance and upgradeability of the SCANFLEX
architecture, while JULIET-Base is based on the low-cost ScanBooster
architecture. Both versions are available in the configurations Run Time Station (RTS), Failure Diagnostics Station (FDS), and Repair/Debug Station (RDS). The latter provides all ScanAssist
Debug-Tools, as well as ScanVision for the graphic presentation of detected faults.
Contact: Goepel electronics LLC, 9600 Great Hills Trail, Suite 150W, Austin, TX 78759
512-502-3010 fax: 512-502-3076 E-mail: firstname.lastname@example.org Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
powered by GIM