Save. Share. Connect.
Monday, July 25, 2016
VOLUME - NUMBER
SEMICON West '16
Atlantic Design/ATX/MDM '16
NEPCON China,SMT/Hybrid Pkg,EDS,EWPTE '16
ATX/MDM West '16
productronica,The ASSEMBLY Show, IMAPS, MDM/Minneapolis '15
Nepcon South China '15
SEMICON West '15
ATX/MDM EAST '15
EDS, SMT/Hybrid Pkg,Wire Tech Expo '15
NEPCON China '15
ATX WEST/APEX '15
AATE and IPC MW 11
SMTAI, Autotest, ATX MW/MDM and Assembly '14
SEMICON West '13
Electronics West/MDM and IPC/APEX '13
SEMICON West '14
NEPCON China, SMT/Hybrid Pkg, EDS, NWPTE '14
IPC APEX '14
Electronics West/MDM 10
ATX Midwest, IMAPS, PCB West '13
ATX West '14
ATExpo & IPC MW 07
NEPCON China '13, EDS, more
SEMICON WEST/Intersolar '12
NEPCON China Product Preview '12
Atlantic Design/MDM 10
Electronics West/MDM 11
SEMICON WEST 10
Atlantic Design/MDM 11
ATLANTIC DESIGN & MFG '13
Atlantic Design/MDM 09
SEMICON WEST 08
NEPCON South China '13
ATExpo & IPC MW 08
Electronics West/MDM 08
NEPCON China Product Preview '13
Electronic West/MDM 09
SMTAI and productronica '13
Multi tradeshow Product Preview '12
AATE/IPC Midwest 10
Electronics West/MDM 12
ATE and IPC MW 09
SMTAI and productronica '13
Atlantic Design/MDM 08
HOME / CURRENT ISSUE
Add Message Board
JTAG Technologies Intros New I/O Module
I/O test module.
Stevensville, MD — JTAG Technologies has introduced the new compact JT 2149/MPV Digital I/O Scan (DIOS) module, which provides test access to PC boards requiring external I/O stimulus and response monitoring. The multi-programmable and multi-voltage (MPV) DIOS plugs directly into the company's QuadPOD
, the standard front-end of the renowned DataBlaster series of boundary-scan JTAG controllers.
When connected to a circuit board via edge connector or fixture test pins, MPV enhances regular interconnect tests by exercising the board's connections in synchronization with the boundary-scan infrastructure. The DIOS module uses the company's all new SCIL
(Scan Configurable Interface Logic) technology to allow custom functions such as pattern generators, counters and bus simulators to be factory-formatted for more advanced functional and pattern-oriented testing.
According to the company, the JT 2149/MPV DIOS Test Module provides a "best-of-both-worlds" solution when it comes to implementing boundary-scan and functional tests. For example, a target circuit board (UUT) may contain elements such as board-edge connectors and non-boundary-scan logic clusters which cannot be accessed directly by the native boundary-scan devices. In such cases, the overall testability of the board could be compromised, allowing some manufacturing faults to go undetected. The new DIOS module overcomes this problem by extending the reach of boundary-scan to include the testing of circuit board edge connectors.
Non-boundary-scan logic clusters can also be more easily tested using "static" patterns or at functional speed utilizing the new SCIL technology.
While the module occupies one of the TAP (Test Access Port) locations in the QuadPOD, the system still provides four independent TAPs to the target UUT by means of MPV's stream-through function. Hot swapping of targets is supported by QuadPOD's automatic power down feature between tests.
Simulation of the former DIOS-type scan devices provides 100 percent backward compatibility with other JTAG I/O scan systems. In addition, both output and input thresholds can be programmed. The output voltage can be programmed in the range of 1.2 to 3.3V in steps of 25mV. The input threshold is set to 50 percent of the output voltage setting.
The I/O channels are grouped into blocks of 16 channels. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed. Selected channels can be interfaced with custom cabling to the board under test (low volume applications) or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals.
Contact: JTAG Technologies, 1006 Butterworth Ct., Stevensville, MD 21666
877-367-5824 fax: 410-604-2108 E-mail: email@example.com Web:
See at APEX Booth #2259.
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | firstname.lastname@example.org
powered by GIM