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Publication Date: 02/1/2009
Archive >  February 2009 Issue >  Product Preview: APEX > 

JTAG Technologies Intros New I/O Module
I/O test module.
Stevensville, MD — JTAG Technologies has introduced the new compact JT 2149/MPV Digital I/O Scan (DIOS) module, which provides test access to PC boards requiring external I/O stimulus and response monitoring. The multi-programmable and multi-voltage (MPV) DIOS plugs directly into the company's QuadPOD, the standard front-end of the renowned DataBlaster series of boundary-scan JTAG controllers.

When connected to a circuit board via edge connector or fixture test pins, MPV enhances regular interconnect tests by exercising the board's connections in synchronization with the boundary-scan infrastructure. The DIOS module uses the company's all new SCIL (Scan Configurable Interface Logic) technology to allow custom functions such as pattern generators, counters and bus simulators to be factory-formatted for more advanced functional and pattern-oriented testing.

According to the company, the JT 2149/MPV DIOS Test Module provides a "best-of-both-worlds" solution when it comes to implementing boundary-scan and functional tests. For example, a target circuit board (UUT) may contain elements such as board-edge connectors and non-boundary-scan logic clusters which cannot be accessed directly by the native boundary-scan devices. In such cases, the overall testability of the board could be compromised, allowing some manufacturing faults to go undetected. The new DIOS module overcomes this problem by extending the reach of boundary-scan to include the testing of circuit board edge connectors.

Non-boundary-scan logic clusters can also be more easily tested using "static" patterns or at functional speed utilizing the new SCIL technology.

While the module occupies one of the TAP (Test Access Port) locations in the QuadPOD, the system still provides four independent TAPs to the target UUT by means of MPV's stream-through function. Hot swapping of targets is supported by QuadPOD's automatic power down feature between tests.

Simulation of the former DIOS-type scan devices provides 100 percent backward compatibility with other JTAG I/O scan systems. In addition, both output and input thresholds can be programmed. The output voltage can be programmed in the range of 1.2 to 3.3V in steps of 25mV. The input threshold is set to 50 percent of the output voltage setting.

The I/O channels are grouped into blocks of 16 channels. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed. Selected channels can be interfaced with custom cabling to the board under test (low volume applications) or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals.

Contact: JTAG Technologies, 1006 Butterworth Ct., Stevensville, MD 21666 877-367-5824 fax: 410-604-2108 E-mail: Web:

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