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Publication Date: 10/1/2008
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SPEA Intros SoC & SiP IC Tester
Multi-channel semiconductor tester. .
Tyler, TX — SPEA has introduced its C600MX SoC & SiP tester. The C600MX adds to the company's Comptest MX family of semiconductor testers enhanced capabilities for the very high multi-site parallel wafer and final test of systems-on-a-chip (SoCs), systems in package (SiPs), MEMS and power devices.

The system provides up to 2.048 channels (analog, digital and mixed-signal), with a low cost per pin, at frequencies up to 200MHz. The true per-pin architecture allows 99 percent parallel test efficiency in multi-site testing of multiple devices. The real parallel test is performed via programmable logic units per pin, timing measurement units per pin, multiple channel digitizers, DSP instrumentation and arbitrary signal generator units for the multiple signal generation and analog acquisition.

The 88 universal slots in the C600MX's test head can be equipped with a complete set of instruments: digitizers, arbitrary waveform generators, counters, analog and digital channels, while the system cabinet can house a range of power generators with up to ±2500V or 30A. This versatility extends the variety of applications to all SiP and SoC devices demanding high voltages or current: automotive semiconductors, analog/digital devices, power management devices, battery chargers and lighting and LED drivers, MEMS and sensors.

Contact: SPEA America, 2609 S SW Loop 323, Tyler, TX 75701 903-595-4433 fax: 903-595-5003 E-mail: Web:

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