Wednesday, October 26, 2016
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New JTAG/Boundary Scan Module from Goepel
JTAG/Boundary Scan module.
Jena, Germany — Goepel electronic, has introduced Module/DIMM244so as another I/O module of the CION product family. The new low-cost digital module is serially controlled via TAP by special CION ASIC chips, and enables the testing of all signal and voltage supply pins of JEDEC Std. (JESD79-2C) compliant DDR2 Mini DIMM 244 sockets providing a cost-effective solution for applications in laptops, PCs and work stations.

The module is plugged directly into the sockets to be tested, and the voltage adaptation of the interface steps is done automatically. Because the modules are equipped with transparent TAP, several boards of the same or different types can be cascaded in a daisy chain configuration. The structural boundary scan test of all DIMM 244 signal and voltage supply pins are executed by the on-board CION ASIC ICs. All channels can be independently switched as


To ensure protection of test equipment and unit under test (UUT), the module provides special safety mechanisms such as "Unstress" to prevent damage caused by shorts, extended power yield and voltage programmable TAP.

The new hardware module is completely supported by all JTAG/Boundary Scan controllers of the ScanBooster and SCANFLEX® families as well the integrated Boundary Scan software platform SYSTEM CASCON.


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