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OC White Intros LED Magnifier
Publication Date: 12/7/2010

Thorndike, MA — O.C. White Co. has introduced its latest state-of-the-art Patent Pending, LED-designed magnifiers. This new series of "Green-Lite" energy-efficient LED magnifiers are said to be the first of their kind.
Promess Intros Hand-Held Calibration Meter
Publication Date: 12/7/2010

Brighton, MI — Promess, Inc. has added a new microprocessor-based, handheld meter for calibration, certification, and verification of both laboratory and production measuring equipment. The new PRO-CM16 includes a digital sensor interface for automatic detection of torque and force sensors, and a ...
Hemco: Economy Clean Rooms
Publication Date: 10/21/2010

Independence, MO — Hemco has introduced its economy Clean Room System incorporating the benefits of modular wall panel construction and the cost-effective clear vinyl strip door entries. These rooms are built to meet class 100 to class 100,000 applications.
MVP: All-in-One Configurable AOI System
Publication Date: 10/21/2010

Carlsbad, CA — Machine Vision Products is demonstrating the Ultra 850G Semiconductor, Packaging and MicroElectronics AOI solution — the latest addition to the company's line of Automated Optical Inspection tools. The system is configurable to be deployed in all aspects of the packaging, die or ...
Nikon Intros Updated CMM/CNC Interface Software
Publication Date: 10/21/2010

Brighton, MI — CMM-Manager 3.0 for Windows 7 from Nikon reportedly offers the most value-for-money tactile inspection software that runs on nearly all CNC (Computerized Numerical Control) and manual CMMs (Coordinate measurement machines).
Vi Technology: Hi-Performance AOI Imager
Publication Date: 10/21/2010

Saint-Egreve, France — Vi Technology's latest semiconductor AOI solution — the Reveal Imager Series is called a breakthrough AOI system for the semiconductor camera modules manufacturing industry. This solution drastically decreases assembly costs and improves the quality levels of image sensors ...
Zeiss Intros New Upright Microscope
Publication Date: 10/21/2010

Thornwood, NY — Carl Zeiss has introduced the Axio Imager Vario, a microscope module for industrial tasks examining large samples that require various contrasting methods, such as solar cells, wafers, flat panel screens or printed circuit boards. The sample space has been adapted to object sizes ...
Zestron Improves Bath Analyzer
Publication Date: 10/21/2010

Manassas, VA — Zestron America has made improvements to its Zestron® Bath Analyzer 10. To further facilitate its user-friendly handling, a digital thermometer displaying both, Celsius and Fahrenheit has been added to the tool case.
Faster Manual Inspection System from Sonoscan
Publication Date: 9/27/2010

Elk Grove Village, IL — Sonoscan has introduced its new FastLine Acoustic Microscope. Specifically designed for accelerated inspection throughput in manual screening of microelectronic devices on the manufacturing floor, it is the industry's newest generation of ultrasonic test equipment. ...
JTAG: New On-board Test Control
Publication Date: 9/27/2010

Eindhoven, The Netherlands — JTAG Technologies is introducing a new support package for board-level and system designers looking to implement a convenient BIT (Built-In Test) access for boundary-scan testing and on-board device (re)programming.
New Low Cost Boundary Scan Controller from Goepel
Publication Date: 9/27/2010

Jena, Germany — Goepel electronic has introduced the SCANBOOSTER/PCIe-DT, a new high-performance, and low cost Boundary Scan controller, as an addition to its SCANBOOSTER® product line. The new controller is compliant with the PCI Express bus specification and supports JTAG/Boundary Scan tests ...
Nordson YESTECH: Hi-Speed AOI/X-Ray Inspection
Publication Date: 9/27/2010

Carlsbad, CA — Nordson YESTECH's high-speed FX Series and BX Benchtop AOI systems are configurable with 5 megapixel color camera imaging technology. With one top-down and 4 side-viewing cameras, the FX Series inspects solder joints and verifies correct part assembly enabling users to improve quality ...
Vi Technology: Selective AOI
Publication Date: 9/27/2010

Saint-Egreve, France — Vi Technology® has introduced its latest Selective Super-resolution technology based on 5K equipment. The new technology expands current K Series inspection capabilities for high throughput and miniaturized applications. State-of-the-art algorithms reconstruct high-resolution ...
XJTAG Supports Micron PCM Memory Chips
Publication Date: 9/27/2010

Cambridge, UK — XJTAG is the first to provide support for Micron Omneo Phase Change Memory (PCM).
 
PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using its boundary scan system. It will allow customers to program ...
Fast Acoustic Microscope from Sonoscan
Publication Date: 8/19/2010

Elk Grove Village, IL — Sonoscan has introduced its high-throughput P300 FastLine C-SAM acoustic microscope which incorporates the SafeLoad carrier system, which permits one tray of parts to be scanned by the transducer while a second tray is being simultaneously loaded.
Goepel Boosts Processor Emulation Speed
Publication Date: 8/19/2010

Jena, Germany — Goepel electronic has introduced new features designed specifically for parallel execution of VarioTAP® Processor Emulation with the Boundary Scan software platform SYSTEM CASCON. These new core functions enable the creation of massive parallel (Gang) test and programming applications ...
Hemco: Fume Hoods Catalog
Publication Date: 8/19/2010

Independence, MO — Hemco has released its "UniFlow Laboratory Fume Hoods" catalog. The 46-page product literature includes the company's line of UniFlow Laboratory Fume Hoods, Custom Hoods and Enclosures.
 
The UniFlow Fume Hood Series includes the new SE, CE, LE, and FM Models. The UniFlow series also ...
IRphotonics Launches Thermal Spot Power Meter
Publication Date: 8/19/2010

Hamden, CT — IRphotonics has introduced a new power meter, the iCure P200 Power Meter for Thermal Spot Curing Systems. The new instrument is described as an accurate tool for measuring optical power from thermal spot curing systems.
 
Developed to work with the iCure AS200 Thermal Spot Curing system, the new Power Meter is a plug-and-play modular tool ...
JTAG Technologies Launches Programming Options
Publication Date: 8/19/2010

Eindhoven, Netherlands — JTAG Technologies is now offering device programming solutions for an array of serial bus types, including SMBus, SPI, I2C and MicroWire.
 
JTAG Technologies has introduced a range of support for the Serial Controlled IC Programmer (SCIP) ...
Nikon: Confocal Metrology for Demanding Applications
Publication Date: 8/19/2010

Brighton, MI — Nikon Metrology, Inc. has introduced the new Confocal NEXIV-K6555 with advanced confocal metrology capabilities to provide new measurement possibilities for demanding applications. Developed on the strength of the company's optical and mechanical technologies, the mew instrument incorporates ...
 
 
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