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ACE Intros Automated Lead Tinning System
Publication Date: 7/23/2008

Spokane Valley, WA — ACE Production Technologies, Inc. has introduced the LTS200 Lead Tinning System, a programmable, automated machine that safely reconditions component leads for Hi-Rel and/or, RoHS applications. It can be used for conventional lead tinning for Hi-Rel applications, or for reconditioning ...
Agilent: AOI System Can Inspect Paste
Publication Date: 4/28/2008

Santa Clara, CA — Agilent Technologies Inc. has introduced a new Automated Optical Inspection (AOI) platform that is fully qualified for all areas of surface mount technology line inspection, including post-, pre- and 2-D capabilities. Developed to tackle today's complex and shrinking assemblies.  Customers reportedly can easily integrate the Medalist sj5000 into production lines where the...
Ascentech: Solder Paste Analyzer
Publication Date: 1/25/2008

Chester, CT — Ascentech, LLC, North American distributor for the GEN3 Systems Ltd. products, has added the ShareGen SPA 1000 Solder Paste Analyzer to its product lineup. The analyzer reportedly provides fast and accurate testing to help control and manage solder paste in the production process. It ...
Automatic Measurements from RAM Optical
Publication Date: 3/26/2008

Rochester, NY — The StarLite GX, from RAM Optical Instrumentation, Inc. (RAM), is a compact non-contact measurement system with an unusual ergonomic design, motorized zoom optics, color camera, and ample 6 x 3 x 5-in. XYZ capacity. The instrument — built for precision measurement — is small ...
Benchtop Temp Forcing System from Thermonics
Publication Date: 9/24/2007

Sunnyvale, CA — Thermonics, Inc. has introduced the T-2650BV Precision Temperature Forcing System (PTFS) for electronic component testing. The system is a true portable benchtop unit, and offers the convenience of portability as well as the ability to operate in environments that may be too space ...
CAMI Cable Tester Adds Spanish Text Option
Publication Date: 1/25/2008

Acton, MA — CAMI Research's CableEye PC-Based Cable and Harness Test System now ships with multi-language capability. When the program's language preference is changed from English to Spanish, screen labels, dialog boxes, advisory screens, and error messages appear in Spanish-language text to help ...
CheckSum Intros In-Circuit Tester
Publication Date: 5/11/2007

Arlington, WA — CheckSum has introduced a new in-circuit tester aimed at users of Agilent 3070-series testers who need to increase test capacity. The Analyst fcs Low-Cost In-Ci ...
Christopher Intros 3D Inspection Profiler
Publication Date: 5/11/2007

Santa Ana, CA — Christopher Associates has introduced its Machvision 3D Profiler for the inspection of laser via topography. One of the critical issues in High Density Intercon ...
Dage Equips X-ray Inspection with 2.0 MegaPixel Imaging
Publication Date: 6/12/2007

Fremont, CA — Dage Precision Industries has equipped its XiDAT XD7600NT digital x-ray inspection system with a standard 2.0 mega pixel imaging system.
Dage Intros Large Board X-Ray Inspection System
Publication Date: 5/11/2007

Fremont, CA — Dage Precision Industries is introducing its newest development in x-ray inspection technology, the Dage XiDAT XD7800 large board format digital x-ray inspection ...
Daylight Intros Improved Magnifying Lamps
Publication Date: 9/23/2008

Denver, CO — Daylight has launched two technologically advanced and high quality magnifying lamps created specifically for the professional market: the circular Ultra Slim and the rectangular Deluxe Magnifying Lamps. Designed to create optimum lighting conditions for individual needs, the new products ...
Desktop AOI System from FocalSpot
Publication Date: 10/30/2008

San Diego, CA — FocalSpot, Inc. has introduced a scanner-based Optical Inspection System named the "FA-Inspector". The new system captures an image of the entire PC board assembly to automate first article inspections and subsequent production inspection tasks without programming. The system uses ...
Digitaltest Intros Test System Upgrades
Publication Date: 12/7/2007

Concord, CA — Digitaltest has introduced an upgrade for its MTS Lambda In-Circuit Tester; throughputs can now be doubled, by enabling two test heads to work in parallel. The system has been designed to address the key features demanded of modern manufacturing test — flexibility, high fault coverage and easy programming...
Digitaltest Upgrades Flying Prober & Compatibility Software
Publication Date: 4/28/2008

Concord, CA — Digitaltest has introduced its second generation Flying Prober Condor MTS-500 which reportedly utilizes unique drive technology, linear motors, and closed-loop technology. The result is a 30 percent faster test operation, while assuring high accuracy in fine pitch applications. Options ...
ECD Intros Thermal Profiler
Publication Date: 9/23/2008

Milwaukie, OR — ECD has introduced a new thermal profiling product called the V-M.O.L.E.® that is designed to complement both board profilers such as the 20-channel MEGAM.O.L.E.®20 and the industry standard SuperM.O.L.E.® Gold, and oven profilers such as OvenRIDER®, and OvenWatch® ...
FocalSpot Adds Mid-Range X-Ray Product System
Publication Date: 6/12/2007

San Diego, CA — FocalSpot, Inc. has introduced the Verifier Plus X-Ray Inspection System, a mid-point addition to the Verifier Series of Portable X-Ray Inspection Systems.
Goepel Boundary Scan Module Used in Aerospace Testing
Publication Date: 6/12/2007

Austin, TX — GOEPEL electronic and the German Aerospace Center DLR-RM (Deutsches Zentrum fuer Luft-und Raumfahrt, Institut fuer Robotik und Mechatronik) have developed the first applications using the new VarioCore technology to test aerospace hardware. The solution is based on the innovative JT ...
Goepel: Boundary Scan Adds Flash Tools
Publication Date: 9/23/2008

Jena, Germany — Goepel electronic is introducing a new generation of intelligent tools for flexible in-system Flash programming (ISP) within the Boundary Scan software platform SYSTEM CASCON. The new automated tool suite supports discrete Flash components, the universal programming of micro controllers (MCU ...
Goepel: Boundary Scan Platform Controllers
Publication Date: 5/11/2007

Austin, TX — Goepel has introduced another series of PXI controllers within the frame of the revolutionary Boundary Scan hardware platform, SCANFLEX. The new SCANFLEX Boun ...
GSI Group Intros In-Line AOI System
Publication Date: 5/11/2007

Wilmington, MA — GSI Group has introduced the SVS Ascent, a completely new platform for in-line, 3-D SMT inspection of solder paste depositions and component placement for proc ...

 

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