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How Flying Probers Optimize Test Strategy
Publication Date: 11/11/2011

Manufacturers are constantly looking for ways to maximize the use of the equipment on their manufacturing floor. Resources are limited, time is precious and traditional testing is being challenged by new technologies that continue the push to design with smaller components.
Boundary-Scan: The Technology Has Grown Up
Publication Date: 11/11/2011

Boundary-scan PCB testing has come of age largely because of easy-to-use and highly automated tools for developing boundary-scan tests. In addition, a newer range of low-cost or even no-cost test utilities have made this technology even more accessible. As a bonus, today's JTAG is also ...
New Test for Pad Cratering
Publication Date: 11/11/2011

A common failure mode in lead-free assemblies is pad cratering, where the contact pad on a printed circuit board or package substrate lifts away from the surface. There are many factors that cause this failure mode to be more prevalent in lead-free assemblies compared to tin-lead assemblies ...
How AOI Ensures Conformal Coating is Working
Publication Date: 11/11/2011

Everyday electronic devices such as mobile phone handsets are increasingly expected to withstand environmental stress while offering greater quality and longer lifetime; attributes that can be enhanced by conformally coating selected areas of their PCBs. In safety related electronics ...
Increased Probe Density with Guided Pin Fixturing
Publication Date: 7/7/2011

Although other test and inspection technologies such as automated optical inspection have tried to supplant it, in-circuit test (ICT), which has been around since the 1970s, still delivers the highest test coverage with the least diagnostic ambiguity at the least cost for circuit board ...
Improving Nano-Scale Imaging with Negative-Stiffness Isolators
Publication Date: 7/7/2011

Traditionally, bungee cords and high-performance air tables have been the vibration isolators most used for scanning probe microscopy (SPM) and near-field scanning optical microscopy (NSOM). The ubiquitous passive-system air tables, adequate until a decade ago, are now being seriously ...
Improving Inspection with Digital Microscopes
Publication Date: 7/7/2011

Visually inspecting parts can be both challenging and time-consuming, especially when using traditional optical microscopes. With a limited depth-of-field, an inability to save images exactly as they are seen, lack of measurement tools and difficulty in properly illuminating a target, inspecting ...
PC Board Product Assurance Testing
Publication Date: 7/7/2011

How can a user of Printed Circuit Boards know they received what they specified? Recently, a field failure called into question some of the traditional methods of ensuring product performance when the failure was traced back to a printed circuit board problem. During analysis of the product ...
Counterfeit Devices: An Ongoing Menace
Publication Date: 7/7/2011

About seven years ago an independent distributor asked us to examine some parts that he had purchased from an offshore source — in this case, mainland China. He was not sure that the parts were marked correctly. He asked we could determine if the parts were, in fact, correctly marked ...
The Ultimate High Resolution AOI Camera
Publication Date: 2/17/2011

The electronics manufacturing industry is a very demanding market with a wide range of inspection requirements. At one end of the spectrum are the high-speed, high-volume production requirements associated with mobile device and LED Back Light Unit (BLU) manufacturing. At the other end ...
What Are the Risks Buying Used X-Ray Systems?
Publication Date: 2/17/2011

Buying a new X-ray system can be an expensive proposition; there are numerous models and an unlimited number of features. One option is to buy a used X-ray system. Used X-ray systems can be a good value for the money spent if you apply some caution.
The Leak Test "Bubble" — Choosing the Right Technology
Publication Date: 2/17/2011

It is the simplest and sometimes the cheapest form of leak testing: seal your part, attach a shop air hose to the part and hold it in a tub for a few seconds looking for bubbles. We all have done it and we all have gotten wet when a major leak erupts in the water. However the time comes ...
Layout-Independent AOI Fault Detection
Publication Date: 2/17/2011

Automatic Optical Inspection (AOI) systems are an essential element in the PCB assembly process; they're needed as part of any quality assurance program. The user can choose from a virtual smorgasbord of system options characterized by many different performance parameters; so that a broad ...
Embedded Instruments for JTAG Testing
Publication Date: 2/17/2011

Traditional test and measurement equipment relies on connecting external probes — not readily possible given the state-of-the-art of today's shrinking electronics. Since probing is so often difficult if not impossible, other methods must be used.
Versatile Boundary Scan Also Programs and Debugs
Publication Date: 9/20/2010

The JTAG standard IEEE 1149.1 — developed by the Joint Test Action Group — was originally developed to facilitate structural testing of assembled PCBs, as well as testing boards where it is impossible to make contact with component pins with external probes. This type of testing becomes ...
Using Reverse Engineering to Recreate Lost CAD Data
Publication Date: 9/20/2010

What do you do when your customer, a major transportation equipment manufacturer has a big problem with its electronics? The company has a large number of older printed circuit boards that are still used for the company's legacy equipment. There is no PC board data in any form. CAD, BOM ...
High Resolution Optical Inspection Solutions
Publication Date: 9/20/2010

As electronic systems get smaller, the division between semiconductor and SMT manufacturing is blurring. For microelectronics inspection the opposite is happening. The division between AOI manufacturers is becoming more defined with only the highest quality AOI manufacturers being able ...
The Case for Functional ATE Testing
Publication Date: 9/20/2010

Project managers within industries such as bio med, alternative energy, smart appliances, communications, consumer electronics and defense now increasingly look to custom designed and manufactured automatic testing equipment (ATE) that can functionally test new products that incorporate ...
Electrically with JTAG/Boundary Scan or Mechanically with ICT?
Publication Date: 9/20/2010

Based on a proposal by the Joint Test Action Group (JTAG) some 15 years ago, the IEEE Std. 1149.1 became the basis of a revolutionary digital test technology for electronic assemblies named Boundary Scan or JTAG. For increasingly complex PCBs, Boundary Scan today is no longer an option ...
Test & Measurement Reaches for Debug
Publication Date: 9/20/2010

Reducing test cycle time while increasing test coverage is an important goal for equipment builders serving all types of markets, including military, aerospace, and transportation.
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