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Q-Star Test nv & Source III Form Strategic Partnership
Brugge, Belgium — Q-Star Test NV, a supplier of advanced high speed and high accurate IDD test and measurement solutions, and Source III, Inc. (El Dorado Hills, CA), a leading developer of test conversion and verification programs, have entered into a strategic partnership and collaboration to enable reducing test engineering efforts, improved test validation and faster test conversion for enhanced chip quality.

The partnership and collaboration targets the automated insertion of Q-Star Test IXXX module control using Source III's VTRAN tool into the test pattern data either when generating a test program starting from ATPG data or when translating from one ATE format to another. Q-Star Test and Source III are happy to announce that as a first result of the cooperation a push-button automated WGL based VTRAN flow has been established and validated by customers that allows automated insertion of Q-Star Test module control into the test pattern data, resulting in a ready to use test program. Further work is focusing on setting up a similar STIL based flow.

The partnership between Q-Star Test and Source III will allow customers to benefit from the combination of products and services offered.

By combining Source III's software solutions with Q-Star Test's measurement hardware, an easy route toward the implementation of a (supply) current based test strategy applicable in a production test environment is created. Meanwhile, customers will benefit from a reduction of test engineering efforts, test program debug time, test time and costs, and an improvement of product quality. The partnership will also allow Q-Star Test and Source III to reinforce their market position and to provide the semiconductor market with cost effective and powerful soft- and hardware solutions to reduce test time and costs.

Contact: Source III, Inc., 3941 Park Drive, #20-342, El Dorado Hills, CA 95762 916-941-9403 fax: 916-941-9404 E-mail: corp@sourceiii.com Web: http://www.sourceiii.com

 
 
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