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Wednesday, October 18, 2017
VOLUME -23 NUMBER 5
Publication Date: 05/1/2008
Front Page News
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Electronic Mfg. Services
Electronic Mfg. Products
Special Feature: Test and Measurement
Product Preview: EDS
May 2008 Issue
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Yamaichi Intros Test & Burn-in Sockets
Test and burn-in socket.
San Jose, — Yamaichi's new open top QFN socket series reportedly has a highly-reliable fine-pitch (0.4/0.5mm) contact system and a standard socket scaling. For automated loading the loader change-kit does not have to be replaced for different package sizes, which helps to save changeover times and costs for all required test and burn-in applications.
The standard socket size was designed as a simple but highly-reliable solution for test and burn-in applications. The new QFN series can be implemented without great effort for different burn-in board IC loader settings.
According to the company, the highly reliable contact mechanism is achieved by the buckling beam contact with a coined contact tip. Zero-insertion force minimizes the IC insertion stress and latch press mechanism ensures a stable contact force. When the push-cover is released, the latch presses onto the surface of the IC which guarantees proper IC seating and necessary contact force contacting the IC pads. The coined tip shape contact ensures a safe and reliable contact of the IC pads creating very low contact resistance.
Contact: Yamaichi Electronics USA, Inc., 475 Holger Way, San Jose, CA 95134
408-715-9100 fax: 408-715-9199 E-mail: firstname.lastname@example.org Web:
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