Friday, October 21, 2016
Publication Date: 05/1/2008
Archive >  May 2008 Issue >  New Products > 

Stress-Screening Reliability Tester from Intepro
Stress-screening reliability tester.
Santa Ana, CA — SEMTest from Intepro Systems is a configurable stress-screening system that is able to perform accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is suitable for both manufacturers and users of power semiconductors who want to qualify COTS devices for use in high reliability applications.

The core of SEMTest is a flexible architecture that can be modified to meet each customer's unusual test requirements. Standard systems can be configured with from 20 to 1000 test cells, but larger systems are available on special order. Each cell has its own local controller to set and monitor either applied or UUT power and other test parameters. Each cell also has a measurement unit for temperature, current, voltage, and timing making it possible for complete characterization and production tests to accelerate failure mechanisms of individual devices and determine functional operating limits.

Primary capabilities include: power cycling for thermal and electrical stressing of devices under test; trend monitoring with user defined warning and control limits; rapid device temperature cycling and ambient temperature profiling; measuring junction temperatures; detecting nascent failures and automatically sending alerts.

Test configurations are quickly programmed through a user-friendly graphical user interface. Setups and measures for each test cell are displayed on the screen and output into an SQL database for fast in-test and post-test analysis.

Contact: Intepro, 1530 Lyon Street, Santa Ana, CA 92705 714-656-3551 fax: 714-953-3150 Web:

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