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Friday, January 09, 2009
February 2008 Issue
test
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Goepel Again Wins Best in Test Award
Jena, Germany — For the third time in a row Goepel electronic won the "Best in Test Award" sponsored by the international magazine and website
Test & Measurement World
. The company applied for the award with its software tool "Scan Assist
" and was rewarded for another outstanding JTAG/Boundary Scan innovation. Scan Assist enables the real-time activation and analysis of individually defined logic states directly in the target hardware (Pin/Net Toggler) without prior test program generation. It automatically identifies potentially unsafe or hardware harming vectors as well as logic states of non-Boundary Scan nets and pins (cluster logic)
The tool uses the central data base of the development environment System Cascon
, and in active state initializes all Boundary Scan structures and administrates the test vectors. That means, the user doesn't need any knowledge about specific TAP control sequences and operation modes, and can concentrate on verification tasks. Logic levels can be provided in object browsers and ASCII files as well as in schematic and Layout Visualizer.
For more information, contact: Goepel electronics LLC, 9600 Great Hills Trail, Suite 150W, Austin, TX 78759
512-502-3010 fax: 512-343-3076 E-mail: us-sales@goepel.com Web:
http://www.goepel.com
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