Save. Share. Connect.
Sunday, May 29, 2016
VOLUME -22 NUMBER 10
Publication Date: 10/1/2007
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Feature: PCB and Assembly
Product Preview: Productronica
October 2007 Issue
Add Message Board
ASSET & Agilent Integrate In-Circuit & JTAG Test
Richardson, TX & Santa Clara, CA — ASSET InterTech Inc. and Agilent Technologies Inc. (NYSE: A) have extended their long-standing joint sales, marketing and licensing agreement under which ASSET's ScanWorks
JTAG system has been integrated into Agilent's 3070, Medalist i5000 and the newer i3070 in-circuit test (ICT) systems as the preferred JTAG solution.
The full integration of ScanWorks into Agilent's ICT platforms allows manufacturers to reduce test costs because boundary-scan tests developed on ScanWorks during design for prototype debug can migrate to ICT systems in high-volume manufacturing lines without additional investment in test development. According to the company, the fully integrated ScanWorks solution for Agilent's ICT systems is the only completely integrated JTAG solution available on any ICT system.
Under the terms of the extended agreement, ASSET continues as Agilent's preferred supplier of boundary-scan systems and intellectual property. Agilent provides worldwide support for ScanWorks on the Agilent i3070, 3070 and i5000 ICT systems.
For more information, contact: Agilent Technologies, Test and Measurement Organization, 5301 Stevens Creek Blvd., MS 54LAK, Santa Clara, CA 95052
or Asset InterTech, Inc., 2201 North Central Expressway, Suite 105, Richardson, TX 75080
888-694-6250 fax: 972-437-2826 E-mail: firstname.lastname@example.org Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
powered by GIM
You were trying to view a protected page.
Please login to gain access or cancel to go back to the site.
Remember User Name
Stay signed in.
Forgot your password?