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Saturday, May 28, 2016
VOLUME -22 NUMBER 9
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Electronic Mfg. Services
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Special Feature: SMT & Production
Product Preview: ATExpo & IPC MW
September 2007 Issue
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PI Intros High-Dynamics XYZ Stage
Auburn, MA — PI (Physik Instrumente) L.P. is offering a new 3-axis nanopositioning/scanning stage, called P-733.3CD.
The high-resolution stage is designed for nanomanipulation, high resolution microscopy and imaging applications. The parallel-kinematics design (only one common moving platform for XYZ) reduces the moved mass. According to the company, stiff design over all axes produces higher operating speeds than with other piezo scanning stages.
These piezo systems provide a positioning and scanning range of 100 x 100µ in X/Y and 10µ in Z axes, and sub-nanometer precision. The large clear aperture (50 x 50mm) is an advantage in transmitted-light applications. The high-speed Z-axis (sub-millisecond response time) can actively compensate out-of-plane, Z-axis deviation during XY scans.
The P-733.3CD is well suited for use in applications such as scanning microscopy, nanomanipulation, metrology/interferometry, biotechnology, semiconductor testing, mask/wafer positioning, and image enhancement/stabilization.
For more information, contact: Physik Instrumente L.P., 16 Albert St., Auburn, MA 01501
508-832-3456 fax: 508-832-0506 E-mail: firstname.lastname@example.org Web:
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