Save. Share. Connect.
Monday, March 27, 2017
VOLUME -22 NUMBER 9
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Feature: SMT & Production
Product Preview: ATExpo & IPC MW
September 2007 Issue
Add Message Board
Keithley Intros Linux-Based Test Systems
Parametric test systems.
Cleveland, OH — Keithley Instruments, Inc. has released a group of enhancements for its S600 Series Parametric Test Systems. The main enhancement is a migration to the Linux Operating System (OS) on the embedded control computer within each test system. This provides a more stable OS and longer service life for the computer, reducing the need for customers to qualify new workstations and upgrade software and hardware resources.
In addition, firmware upgrades will provide throughput improvements compared to the earlier UNIX-based systems. A new software licensing method incorporates a hardware key for each tester in the form of a USB Stick, which can be transferred from workstation to workstation for fast repair times.
Keithley's parametric test systems with Linux controllers join the growing list of semiconductor equipment types that now utilize the Linux OS. According to the company, its RF and parallel test options and appropriately designed test structures and probe cards make the Model S680 the only RF test system on the market that can make simultaneous DC and RF measurements in parallel within the same probe touchdown. This reportedly yields substantially higher throughput than similar methods that perform sequential DC measurements followed by RF measurements.
By using the new Linux controller, the system will be compatible on a mixed system test floor. For customers who prefer a 100 percent Linux test floor, field upgrades are available. In any case, a newly installed Linux controller will operate seamlessly with existing parametric test systems operating under Solaris.
The new systems will have Red Hat Enterprise Linux WS Version 4, Update 4, and a new x86-based computer. Aside from the RF and parallel test options, these systems can also be purchased with the adaptive test option and 300mm wafer automation option.
For more information, contact Keithley Instruments, Inc., 28775 Aurora Road, Cleveland, OH 44139
800-688-9951 or 440-248-0400 E-mail: firstname.lastname@example.org Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
powered by GIM