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VOLUME -22 NUMBER 6
Publication Date: 06/1/2007
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Product Preview: Atlantic Design/MDM
June 2007 Issue
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Keithley Launches Integrated Test Systems
Integrated test system.
Cleveland, OH — Keithley Instruments, Inc. has introduced its ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level. The ACS integrated test systems reportedly offer unique measurement capabilities with powerful automation-oriented software. ACS test systems provide faster measurements and greater system flexibility under one uniform software suite to fit unique test application needs.
The ACS integrated test systems incorporate a variety of test hardware and overall unique measurement capability: the company's powerful Model 4200-SCS Semiconductor Characterization System has I-V source-measure and specialized pulse testing packages, such as the Model 4200-PIV package for testing of advanced semiconductor materials.
Series 2600 SourceMeter
Instruments include TSP-Link
and Test Script Processor (TSP)
for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterization.
Series 2400 SourceMeter
Instruments feature high voltage and high current sourcing, which are unique in applications such as high power MOSFETs and display drivers. Optional switching, C-meters, and pulse generators round out the instrument capabilities of ACS integrated test systems.
ACS integrated test systems are available in basic benchtop configurations or in factory-integrated full-height rack configurations.
For more information, contact: Keithley Instruments, Inc., 28775 Aurora Rd., Cleveland, OH 44139-1891
800-688-9951 or 440-248-0400 fax: 440-248-6168 E-mail: email@example.com Web:
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