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Monday, June 27, 2016
VOLUME -22 NUMBER 5
Publication Date: 05/1/2007
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May 2007 Issue
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Seica Intros Latest Flying Probe Tester
Pilot VIP flying probe tester.
Salem, NH — Based on Seica's proprietary VIVA Integrated Platform (VIP
) core hardware and software, the new Aerial Flying Probe test system has been launched. Designed to meet today's industry demands, the system's simple programming and operation mean it can be operated by specialist and non-specialist test personnel alike as part of a highly cost-effective test strategy.
Especially suitable for testing prototypes, samples and small-to-medium production runs, the tester reportedly reduces the investment and time needed for board development while providing maximum test flexibility.
This is in part due to four completely independent, mobile test probes, two on each side of the test board, that enable simultaneous, accurate double-sided testing, while the company's proprietary OTPN (One Touch Per Net) technique quickly characterizes the net and identifies faults on subsequent test boards. Additional tests such as junction fault verification are executed at the same time, simplifying and speeding up test program generation and maximizing fault coverage and throughput.
Data collection and statistics functions come as standard, and the system's capabilities can be further expanded with optional in-circuit test and visual inspection software modules. Using the VIP environment, the system is also fully compatible with the company's Pilot Flying Probe, and its Strategy In-circuit and Valid Functional testers, making Aerial even more versatile.
The full-performance Pilot VIP Flying Probe system integrates a complete set of test tools and techniques that enable it to perform the entire range of in-circuit and functional tests, as well as provide additional capabilities such as AOI Inspection, Boundary- scan and On-board programming.
For more information, contact: Seica Inc., 50A Northwestern Drive, Suite 10, Salem, NH 03079
603-890-6002 fax: 603-890-6003 Web:
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