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Sunday, December 4, 2016
VOLUME - NUMBER
NEPCON South China '16
SEMICON West '16
Atlantic Design/ATX/MDM '16
NEPCON China,SMT/Hybrid Pkg,EDS,EWPTE '16
ATX/MDM West '16
productronica,The ASSEMBLY Show, IMAPS, MDM/Minneapolis '15
Nepcon South China '15
SEMICON West '15
ATX/MDM EAST '15
EDS, SMT/Hybrid Pkg,Wire Tech Expo '15
NEPCON China '15
ATX WEST/APEX '15
AATE and IPC MW 11
SMTAI, Autotest, ATX MW/MDM and Assembly '14
SEMICON West '13
Electronics West/MDM and IPC/APEX '13
SEMICON West '14
NEPCON China, SMT/Hybrid Pkg, EDS, NWPTE '14
IPC APEX '14
Electronics West/MDM 10
ATX Midwest, IMAPS, PCB West '13
ATX West '14
ATExpo & IPC MW 07
NEPCON China '13, EDS, more
SEMICON WEST/Intersolar '12
NEPCON China Product Preview '12
Atlantic Design/MDM 10
Electronics West/MDM 11
SEMICON WEST 10
Atlantic Design/MDM 11
ATLANTIC DESIGN & MFG '13
Atlantic Design/MDM 09
SEMICON WEST 08
NEPCON South China '13
ATExpo & IPC MW 08
Electronics West/MDM 08
NEPCON China Product Preview '13
Electronic West/MDM 09
SMTAI and productronica '13
Multi tradeshow Product Preview '12
AATE/IPC Midwest 10
Electronics West/MDM 12
ATE and IPC MW 09
SMTAI and productronica '13
Atlantic Design/MDM 08
Add Message Board
Koh Young Unveils New 3D Measurement System
HORUS measurement on a TSV (through silicon via) package.
San Francisco, CA — Sharp-eyed like a falcon, Koh Young's new HORUS inspection system is named after the ancient Egyptian falcon god, and provides unexpected capabilities and special powers. While the system excels at semiconductor applications, it is especially suitable for the full range of electronics manufacturing and assembly applications including board-level SMT.
For example, HORUS can measure the volume and dimension of virtually any type of substance, part, component, die, including very small features, very quickly and with astonishing accuracy. It can also precisely measure transparent and shiny materials with high speed and accuracy, something that no other inspection systems currently available can do.
HORUS will help customers realize higher yields in Semiconductor and Advanced Packaging applications by measuring objects that have been considered difficult to measure with appreciable speed — without sacrificing accuracy.
The system's primary advantage over current systems is that HORUS can measure virtually any object, and is particularly capable of precisely measuring transparent ones at production speeds. It is the first machine with this capability to enter the market.
It can measure shiny objects including flux and solder balls using its very wide Field of View (FOV) optics. The combination of wide FOV and quick inspection speed allows HORUS to be used as an in-line inspection machine. This will also facilitate lot testing on all products, rather than traditional sampling inspection made necessary by slow inspection speeds.
Contact: Koh Young America Inc., 6150 W. Chandler Blvd., Suite #39, Chandler, AZ 85226
480-403-5000 fax: 480-403-5001 E-mail: email@example.com Web:
See at NEPCON South China Booth #A1-P45.
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