Thursday, May 24, 2018
Home/Current Issue >  New Products > 

Heidenhain's QUADRA-CHEK v3.0.3 Upgrade Now Available
Measuring system upgrade now available.
Schaumburg, IL — Now available, the latest release of Heidenhain's PC-based IK 5000 QUADRA-CHEK metrology software (version 3.0.3) provides advanced functionality for both new and used quality control inspection equipment. The IK 5000 can be used to retrofit multiple brands and types of inspection equipment — such as CMMs and video measuring microscopes — making it easy to cross-train employees on a variety of machines.

With the ability to operate on 32-bit or 64-bit PCs using either Microsoft Windows 7 or 8 operating systems, the IK 5000 is a good choice when standardizing inspection packages in most Quality Control departments. Since Microsoft no longer offers support for the Windows XP operating systems, many of the machines currently using it will need to be upgraded, and this universal PC package solution for 2D and 3D measuring tasks is quite suitable when making this change.

Notable features within the IK 5000 include improved functions in Automatic Video Edge Detection, Auto Focus functionality, and CNC capabilities for video Inspection machine users who will now have a wide range of options enabling automated, hands-free inspection. For the users desiring a "Field of View" inspection, this option is available as well. CMM users can utilize the optional 3D Profiling capability which offers graphic evaluation of 3D contours, comparing CAD files (either STEP or IGES) to the actual measured part. Also, the IK 5000 supports multiple models of Renishaw touch probe heads, bodies and tips.

Existing IK 5000 customers can update their software to the latest version 3.0.3 free of charge, but should consult the machine manufacturer or the local metrology distributor before running the update to be certain that the hardware and software settings are compatible.

Contact: Heidenhain Corp., 333 E. State Parkway, Schaumburg, IL 60173 847-490-1101 fax: 847-490-3031 E-mail: Web:

search login