TORRANCE, CA —
Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces plans to participate in the Printed Board Assembly Cleaning and Contamination Testing Center during the upcoming IPC APEX EXPO, scheduled to take place February 19-21, 2013 at the San Diego Convention Center. The HIROX Digital Microscope will be operated in booth #1549. The center will provide practical support to visitors keen to implement new cleaning and contamination monitoring processes as well as overcome reliability failures.
The digital microscope allows a sample to be observed directly through a lens. HIROX Microscopes are optimized for the characteristics of the imaging sensor — a flat, 2-D array with a known readout rate, response curve, pixel size, etc.
Objects may be inspected dynamically in 360° with the patented HIROX design. Additionally, using the microscope, superior BGA inspection is capable up to 200X magnification. Low maintenance costs are achieved with the use of a spring loaded lens tip to protect samples. Additionally, the microscope is highly configurable and features a flexible lineup of lenses and peripheral devices. Other standard features include optimal illumination using a metal halide lamp for balanced color spectrum, a multitude of 2-/3-D profiling features are available for a wide range of applications, and customization is available for tailoring to client-specific needs.
The Printed Board Assembly Cleaning and Contamination Testing Center will demonstrate ionic testing, surface insulation resistance (SIR), solder paste flux cleaning system, cleaning materials, optical inspection, PCB and component compatibility testing, among other processes. The clinic is organized by IPC and National Physical Laboratory.
For more information, meet company representatives in Seika’s booth #2727 at the IPC APEX EXPO or visit www.seikausa.com.