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Monday, June 27, 2016
VOLUME -27 NUMBER 12
Publication Date: 12/1/2012
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Special Features: Test and Measurement
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December 2012 Issue
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New Heidenhain Metrology Software Increases Functionality
New metrology software increases functionality.
Schaumburg, IL — Heidenhain has introduced the latest version of its PC-based QUADRA-CHEK Metrology software designed to provide advanced functionality for inspection measurement machines. This software makes it possible to conveniently perform 2-D and 3-D measuring tasks when standard DRO products will not suffice. Labeled the IK5000 version 2.96.2, this powerful inspection package builds upon the original Metronics QUADRA-CHECK QC5000 software by introducing new functionality such as 3D Profiling capabilities that can provide measurement and graphic evaluation of 3-D contours using multi-sensor and tactile measuring machines. This new option, used for profile measurements, is able to import a 3D CAD file (either STEP or IGES) and compare it with the actual measured part. This version now supports new Auto Focus functionality to allow for the desired search distance to be directly entered into the search distance field. Previously the algorithm used the Teach function to determine the optimum search distance and Z axis velocity depending on the camera frame rate, which could cause intermittent failures depending on the part surface and if it was significantly different from the surface used during the Teach process.
Part Programming improvements were added to support compensation for the thermal behavior of products that experience a shrinkage or growth of material during the manufacturing process. This will allow users to write a single inspection programs for measuring parts with materials having a known growth or shrink rate throughout the manufacturing process.
Improvements were also added to currently existing Radial and Palletize methods of automatic part programming routines. These methods are designed to help users when there are common features or parts that repeat angularly, around a datum, or based on a palletized grid layout. The new Palletize grid functionality will allow the user to graphically select which parts in the grid are required for measurement, and only run the program in those locations.
The IK5000 version 2.96.2 now also offers compatibility for PCs using Windows 7 (32bit) operating systems as well as Windows XP and Vista.
Contact: Heidenhain Corp., 333 E. State Parkway, Schaumburg, IL 60173
847-490-1191 fax: 847-490-3931 E-mail: firstname.lastname@example.org Web:
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