Thursday, August 25, 2016
VOLUME -27 NUMBER 12
Publication Date: 12/1/2012
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ARCHIVE >  December 2012 Issue >  Special Features: Test and Measurement > 
Complex Serialization: An Approach for Today


Device programming systems are a key resource in the electronics industry for writing customer-supplied data patterns such as Intel HEX, Motorola S-record, POF and other file formats into blank semiconductor devices. Traditionally, a data pattern is loaded into the device programming ...
Measuring Losses in Switch-Mode Power Supplies


Switch-mode power supplies are known for efficiencies that can run into the high 90 percent range, a far cry from the 50-60 percent efficiencies one may expect from the older technology of linear power supplies. Power-supply efficiency is a measure of how much energy is wasted between ...
Tracking Down Counterfeit ICs


Today's most prevalent counterfeit chips reportedly represent $169 billion in potential risk per year for the global electronics world, according to market research firm IHS iSuppli. The most vulnerable chip types include analog ICs, microprocessors, memory ICs, and programmable logic ...

X-Ray Inspection to Identify Counterfeit Parts


Radiography (x-ray inspection) is a technique that is central to all recent and upcoming counterfeit detection standards, including IDEA 1010B, CCAP 101, AS5553, AS6081, and AS6171. X-ray inspection provides the unique ability to "see" what is inside an electronic component without ...
Combining 2D and 3D in a Single AOI Platform


Advanced miniature packaging has led to ever-increasing PCB density and complexity. As the manufacturing process becomes progressively more complicated, there is the probability for defects on many finished PCB assemblies. For years the Automated Optical Inspection (AOI) industry has ...
 
 
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