MINNEAPOLIS, MN -
CyberOptics Corporation (Nasdaq: CYBE) will feature its newest range of AOI and SPI systems in Hall 03 , booth #3210 at the upcoming productronica India exhibition, scheduled to take place September 11-13, 2012 in Bangalore, India. CyberOptics’ unique value-add initiatives such as one-step SPI/AOI programming, AOI-SPI correlation analysis and printer closed-loop feedback capability also will be featured.
The QX100™ redefines tabletop inspection by combining the performance of an in-line inspection system with the flexibility of a tabletop system. The system features CyberOptics’ unique image acquisition technology, the Strobed Inspection Module (SIM) and is capable of inspecting component sizes down to 01005.
The sleek QX100™ is powered by AI2 (Autonomous Image Interpretation), a patented next-generation image analysis technique that provides superior defect detection capabilities, lowest false call rates and improved clarity of defect identification. With AI2 technology, programming gets faster — with a dramatic 90 percent reduction in examples, and simpler with full support for unsupervised and semiautomatic model training. A single workflow setup makes QX100™ an ideal choice for high-mix environments. Programs created on QX100™ are 100 percent compatible with in-line systems.
On the SPI front, CyberOptics will feature its newest 3-D SPI system, the SE500ULTRA™, designed with an all-new, ultra-fast sensor setting a new benchmark for SPI inspection speed. The sensor combined with CyberOptics’ unique “all-in-one” scan algorithm positions the SE500ULTRA™ to be 30 percent faster than its predecessor SPI systems with zero compromise on measurement accuracy and repeatability.
Additionally, the system includes a Dual Illumination sensor option to further improve repeatability and reproducibility on the very smallest of paste deposits.
The CyberOptics team looks forward to welcoming visitors to Hall 03, booth #3210 during the productronica India exhibition.